Phase field models and higher-order active contours

Rochery, M.; Jermyn, I.H.; Zerubia, J.

doi:10.1109/iccv.2005.189

Phase field models and higher-order active contours

Rochery, M.; Jermyn, I.H.; Zerubia, J.

Authors

M. Rochery

Professor Ian Jermyn i.h.jermyn@durham.ac.uk
Professor

J. Zerubia

Abstract

The representation and modelling of regions is an important topic in computer vision. In this paper, we represent a region via a level set of a 'phase field' function. The function is not constrained, e.g. to be a distance function; nevertheless, phase field energies equivalent to classical active contour energies can be defined. They represent an advantageous alternative to other methods: a linear representation space; ease of implementation (a PDE with no reinitialization); neutral initialization; greater topological freedom. We extend the basic phase field model with terms that reproduce 'higher-order active contour' energies, a powerful way of including prior geometric knowledge in the active contour framework via nonlocal interactions between contour points, in addition to the above advantages, the phase field greatly simplifies the analysis and implementation of the higher-order terms. We define a phase field model that favours regions composed of thin arms meeting at junctions, combine this with image terms, and apply the model to the extraction of line networks from remote sensing images.

Citation

Rochery, M., Jermyn, I., & Zerubia, J. (2005). Phase field models and higher-order active contours. In Tenth IEEE International Conference on Computer Vision : proceedings : Beijing, China, October 17-20, 2005 (970-976). https://doi.org/10.1109/iccv.2005.189

Conference Name	IEEE International Conference on Computer Vision (ICCV)
Conference Location	Beijing, China
Start Date	Oct 17, 2005
End Date	Oct 21, 2005
Publication Date	Oct 21, 2005
Deposit Date	Aug 12, 2011
Publicly Available Date	May 10, 2016
Pages	970-976
Series ISSN	1550-5499
Book Title	Tenth IEEE International Conference on Computer Vision : proceedings : Beijing, China, October 17-20, 2005.
ISBN	076952334X9
DOI	https://doi.org/10.1109/iccv.2005.189
Additional Information	Date of Conference: 17-21 October 2005

Files

Accepted Conference Proceeding (268 Kb)
PDF

Copyright Statement
© 2005 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.