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Monolithically Integrated Microcavity Lasers on Silicon

Gong, Y; Xie, W; Huang, Y; Zhou, T; Ma, J; Tang, M; Sun, X; ... Zhang, Z; + view all (2023) Monolithically Integrated Microcavity Lasers on Silicon. In: Asia Communications and Photonics Conference, ACP. (pp. pp. 1644-1646). IEEE: Shenzhen, China. Green open access

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Abstract

In recent years, due to the limitation of Moore's Law, traditional electronic integrated circuits have been unable to meet the requirements of exponential growth of data traffic. An optical interconnect paradigm with higher density of processing units and lower energy consumption is urgently needed. Highly integrated III-V lasers on silicon are promising candidates for ultra-compact light sources of the next generation on-chip optical interconnect. Here, we present various InAs/GaAs quantum dot microcavity lasers monolithically grown on silicon, including micro-disk lasers, 2D Photonic Crystal lasers with L3 defects, 1D Photonic Crystal nanobeam lasers, Photonic Crystal bandedge lasers, topological corner state lasers, Dirac-vortex topological lasers and vortex lasers based on bound states in the continuum (BIC).

Type: Proceedings paper
Title: Monolithically Integrated Microcavity Lasers on Silicon
Event: 2022 Asia Communications and Photonics Conference (ACP)
Dates: 5 Nov 2022 - 8 Nov 2022
ISBN-13: 9781665481557
Open access status: An open access version is available from UCL Discovery
DOI: 10.1109/ACP55869.2022.10089139
Publisher version: https://doi.org/10.1109/ACP55869.2022.10089139
Language: English
Additional information: This version is the author accepted manuscript. For information on re-use, please refer to the publisher’s terms and conditions.
Keywords: microcavity lasers; PICs; quantum dot material; Si substrates
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: https://discovery.ucl.ac.uk/id/eprint/10171157
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