Challenges and examples of in-situ memory content extraction techniques
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Peer-reviewed
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Courbon, Franck Rene
Abstract
We present embedded devices memory elements - from core registers to off chip-use, type and architecture before summarising their features regarding extraction techniques at scale. We list recent and on-going attack platform methodologies prior analysing their pros and cons. Particularly of importance, we address combined attack approaches, signal processing techniques and the challenges of low cost extraction methodologies. Above all, we characterise beam-based extraction techniques, starting from sample preparation before concluding on in-situ memory content extraction limits and countermeasures.
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25th IEEE International Conference on Electronics Circuits and Systems
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Isaac Newton Trust (17.08(b))
Leverhulme Trust (unknown)
Leverhulme Trust (unknown)