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oaioai:directory.doabooks.org:20.500.12854/90111

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

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    Publication date
    27 July 2022
    Publisher
    'IntechOpen'
    Doi

      Abstract

      This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy

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      Last time updated on 11/10/2022

      This paper was published in Directory of Open Access Books (DOAB).

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