Repository landing page

We are not able to resolve this OAI Identifier to the repository landing page. If you are the repository manager for this record, please head to the Dashboard and adjust the settings.

High-Angle Grain Boundary Migration in Aluminium Bicrystals

Abstract

The measurement of grain boundary migration in pure Al bicrystals by X-ray continuous interface tracking is introduced. This method provides information on the mobility of specific grain boundaries without interfering with the process of migration. Moreover, the effect of hydrostatic pressure on grain boundary migration was investigated. Several topics of grain boundary motion relevant to microstructure and texture evolution by recrystallization and grain growth were addressed. It was found that the maximum growth rate misorientation changes with temperature from the exact ∑7 orientation relationship to a 40.50° rotation. This behavior is of concern for recrystallization texture evolution. The effect of material purity on grain boundary migration is shown not to be confined to drag effects but also to involve changes of grain boundary structure. From the activation volume of grain boundary mobility it has to be concluded that at least tilt boundaries move by cooperative motion (group mechanism) of atoms in the boundary

Similar works

Full text

thumbnail-image

EDP Sciences OAI-PMH repository (1.2.0)

redirect
Last time updated on 10/04/2020

This paper was published in EDP Sciences OAI-PMH repository (1.2.0).

Having an issue?

Is data on this page outdated, violates copyrights or anything else? Report the problem now and we will take corresponding actions after reviewing your request.