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Berlin : Weierstraß-Institut für Angewandte Analysis und Stochastik
Doi
Abstract
In this article a topological sensitivity framework for far field
detection of a diametrically small electromagnetic inclusion is established.
The cases of single and multiple measurements of the electric far field
scattering amplitude at a fixed frequency are taken into account. The
performance of the algorithm is analyzed theoretically in terms of its
resolution and sensitivity for locating an inclusion. The stability of the
framework with respect to measurement and medium noises is discussed.
Moreover, the quantitative results for signal-to-noise ratio are presented. A
few numerical results are presented to illustrate the detection capabilities
of the proposed framework with single and multiple measurements
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