Design a Low Power Built in Self-Test (BIST) Architecture for Fast Multiplier and Optimize in Terms of Real Time Functionality

Abstract

Aiming low power during testing, Maypresent a methodology for derivingBIST Architecture forfast Multipliers. In my propose Researchseveral design rules for designing the Wallace tree in order to be fully testable under the cell fault model. The proposed low power BISTArchitecture for the derived multipliers is achieved by: (i) IntroducingTest Pattern Generators (ii) Properly assigning the TPGsoutputs to the multiplier inputs and(iii) Significantly reducing the test vector length. In this work, I have implemented 4bit * 4bit Multiplier with many test pattern generators (TPG) alternative. A BIST TPG Architecture was use of 6 bit counter. I have calculated operation speed, time delay, area, power consumption for Design. Reductionof power dissipationachieved byproperly assigning the TPG output to the multiplier input,significantly reducing the test set length, suitableTPG built of a6-bit counter DOI: 10.17762/ijritcc2321-8169.150317