The I-V characteristic comparison method in electronic component diagnostics

Abstract

I-V characteristics of individual electronic components or electronic circuits have been playing a very important role in diagnostics for many years. The latest technological advance has extended the analytical potential of that method even more. This paper presents some examples how the I-V characteristic comparison can reveal the differences between the chosen approved model component and some other alternative components manufactured by different producers. The differences might be caused also with a treatment history like thermal or electrostatic discharge exposition. Copyright © (2012) by the International Measurement Federation (IMEKO)