Design of a Built-In Test Equipment for a X-band phased array radar system in SiGe BiCMOS technology

Abstract

In this work an X band Build In Test Equipment (BITE), implemented in the SiGe BiCMOS technology of Infineon, is presented. The possibility to perform precise measurements of phase shift and gain in the X- band, using lower frequency ( 4GHz-6GHz) automated test equipment (ATE), which is also used in WLAN devices, is investigated, leading to the design of the complete test equipment and finally to the full custom layout designopenEmbargo per motivi di segretezza e/o di proprietà dei risultati e informazioni di enti esterni o aziende private che hanno partecipato alla realizzazione del lavoro di ricerca relativo alla tes